Ciqtek – FESEM | SEM4000X

CIQTEK FESEM – SEM4000X

Stable, Versatile, Flexible, and Efficient

The CIQTEK FESEM – SEM4000X is a stable, versatile, flexible, and efficient field emission scanning electron microscope (FE-SEM). It achieves a resolution of 1.9nm@1.0kV, and easily tackles high-resolution imaging challenges for various types of samples. It can be upgraded with an ultra-beam deceleration mode to enhance low-voltage resolution even further.

The microscope utilises multi-detector technology, with an in-column electron detector (UD) capable of detecting SE and BSE signals while providing high-resolution performance. The chamber-mounted electron detector (LD) incorporates a crystal scintillator and photomultiplier tubes, offering higher sensitivity and efficiency, resulting in stereoscopic images with excellent quality. The graphic user interface is user-friendly, featuring automation functions such as automatic brightness & contrast, auto-focus, auto-stigmator, and automatic alignment, allowing for rapid capture of ultra-high resolution images.

Key Features:

  • High Resolution
  • Multi-detector Technology
  • Simplified Alignment
  • Built from a Higher-end Platform
  • Ultra Beam Deceleration Mode Technology *(Optional)
  • Excellent Expandability

CIQTEK FESEM – SEM4000X

Stable, Versatile, Flexible, and Efficient

The CIQTEK FESEM – SEM4000X is a stable, versatile, flexible, and efficient field emission scanning electron microscope (FE-SEM). It achieves a resolution of 1.9nm@1.0kV, and easily tackles high-resolution imaging challenges for various types of samples. It can be upgraded with an ultra-beam deceleration mode to enhance low-voltage resolution even further.

The microscope utilises multi-detector technology, with an in-column electron detector (UD) capable of detecting SE and BSE signals while providing high-resolution performance. The chamber-mounted electron detector (LD) incorporates a crystal scintillator and photomultiplier tubes, offering higher sensitivity and efficiency, resulting in stereoscopic images with excellent quality. The graphic user interface is user-friendly, featuring automation functions such as automatic brightness & contrast, auto-focus, auto-stigmator, and automatic alignment, allowing for rapid capture of ultra-high resolution images.

Key Features:

  • High Resolution
  • Multi-detector Technology
  • Simplified Alignment
  • Built from a Higher-end Platform
  • Ultra Beam Deceleration Mode Technology *(Optional)
  • Excellent Expandability

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