CIQTEK Tungsten Filament SEM3300
Next-generation Tungsten Filament Scanning Electron Microscope
The CIQTEK Tungsten Filament SEM3300 scanning electron microscope (SEM) incorporates technologies such as “Super-Tunnel” electron optics, in-lens electron detectors, and electrostatic & electromagnetic compound objective lenses. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.
Key Features:
- Break Through the Resolution Limit of Tungsten Filament SEMs
- In-Lens Electron Detector
- Electromagnetic & Electrostatic Combo Objective Lens
- Safer to Use
- Excellent Expandability
▶ Optical Navigation
Using a vertically mounted chamber camera to capture optical images for specimen stage navigation allows for a more intuitive and accurate specimen positioning.
▶ Auto Functions
Improved Automatic Brightness & Contrast, Automatic Focus, and Automatic Astigmatism Correction Functions. Imaging by a single click!
▶ Safer to Use
- Infrared CCD – Real-time chamber interior motion monitoring using image recognition and motion capture technology.
- Anti-collision (Software) – Manually input the sample height to accurately define the distance between the sample and the objective lens to prevent collisions.
- Anti-collision (Hardware) – Shut off the power to the stage motor at the moment of collision to minimise damage.
▶ Easy Filament Replacement
Pre-aligned replacement filament module ready to use.
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