Ciqtek – Ultra-High Res FESEM | SEM5000X

CIQTEK SEM5000X

Ultra-high Resolution Field Emission Scanning Electron Microscopy (FESEM) Challenges the Limits

The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimised electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips.

Key Features:

• Breakthrough Resolving Power
• Mechanical Eucentric Specimen Stage
• (Optional)Dual Beam Deceleration Mode (Duo-Dec)
• (Optional) Specimen Exchange Loadlock (8 inches compatible)
• High Stability
• Excellent Expandability